Chia Nan University of Pharmacy & Science Institutional Repository:Item 310902800/8948
English  |  正體中文  |  简体中文  |  全文笔数/总笔数 : 18269/20496 (89%)
造访人次 : 10563194      在线人数 : 746
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
搜寻范围 查询小技巧:
  • 您可在西文检索词汇前后加上"双引号",以获取较精准的检索结果
  • 若欲以作者姓名搜寻,建议至进阶搜寻限定作者字段,可获得较完整数据
  • 进阶搜寻
    Please use this identifier to cite or link to this item: https://ir.cnu.edu.tw/handle/310902800/8948


    標題: 有機薄膜製作及其在氣體感測器應用的研究---真空蒸鍍有機薄膜及其在氣體感測器應用的研究
    Vacuum Deposition of Organic Thin Films and the Application on Gas Sensor
    作者: 李玉郎
    Yuh-Lang Lee
    貢獻者: 醫藥化學系
    關鍵字: 鈦花青
    真空蒸鍍
    氣體感測器
    晶體結構
    有機薄膜
    Phthalocyanine
    Vacuum deposition
    Gas sensor
    Crystal structure
    Organic thin film
    日期: 1999
    上傳時間: 2008-11-19 15:21:18 (UTC+8)
    出版者: 台南縣:嘉南藥理科技大學醫藥化學系
    摘要: 本研究以銅當中心金屬,以物理氣相蒸鍍法將CuPc及蒸鍍在玻璃基板、金基質面以及電極上,藉由改變熱處理條件來製備薄膜,並利用X光繞射法(XRD)及掃描式電子顯微鏡(SEM)分析其薄膜晶相及表面結構,並探討其對二氧化氮氣體感測特性的影響。 就薄膜結構而言,經熱處理後CuPc表面形態由無結晶方向變為與基板傾斜的結晶方向。在二氧化氮氣體感測的結果發現,未經熱處理的薄膜因無結晶性而有較大的表面積,故靈敏度最大,但所需的回復時間也最長。
    Copper phthalocyanine (CuPc) was vacuum deposited onto substrates of glass, gold, and electrode to study the effects of heat treatment on the film structure and the related sensing properties to NO/sub 2/. The surface morphology and the crystal structure are investigated by scanning electron microscopy (SEM) and X-ray diffraction (XRD), respectively. The films without heat treatment showed an amorphous and fine-grain structure. Due to its looser structure, a higher surface area and thus, higher sensitivity were resulted. However, the recovery time is longer, which is related to the in-diffusion of NO/sub 2/ into the bulk phase.
    關聯: 計畫編號:NSC88-2214-E041-004
    Appears in Collections:[食藥產業暨檢測科技系(含五專)] 科技部計畫

    Files in This Item:

    File Description SizeFormat
    index.html0KbHTML1086View/Open
    NSC88-2214-E041-004.pdf584KbAdobe PDF714View/Open


    All items in CNU IR are protected by copyright, with all rights reserved.


    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - Feedback