English  |  正體中文  |  简体中文  |  Items with full text/Total items : 17744/20032 (89%)
Visitors : 7292510      Online Users : 305
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version
    Please use this identifier to cite or link to this item: http://ir.cnu.edu.tw/handle/310902800/23253


    標題: CuO impregnated activated carbon for catalytic wet peroxide oxidation of phenol
    作者: Rey-May Liou
    Shih-Hsiung Chen
    貢獻者: 環境工程與科學系
    關鍵字: Activated carbon
    Copper
    Catalytic wet peroxide oxidation
    Phenol
    日期: 2009-12
    上傳時間: 2010-11-18 11:46:01 (UTC+8)
    摘要: This paper presents an original approach to the removal of phenol in synthetic wastewater by catalytic wet peroxide oxidation with copper binding activated carbon (CuAC) catalysts. The characteristics and oxidation performance of CuAC in the wet hydrogen peroxide catalytic oxidation of phenol were studied in a batch reactor at 80 �C. Complete conversion of the oxidant, hydrogen peroxide, was observed with CuAC catalyst in 20 min oxidation, and a highly efficient phenol removal and chemical oxygen demand (COD) abatement were achieved in the first 30 min. The good oxidation performance of CuAC catalyst was contributed to the activity enhancement of copper oxide, which was binding in the carbon matrix. It can be concluded that the efficiency of oxidation dominated by the residual H2O2 in this study. An over 90% COD removal was achieved by using the multiple-step addition in this catalytic oxidation.
    關聯: Journal of Hazardous Materials 172(1):p.498-506
    Appears in Collections:[環境工程與科學系(所)] 期刊論文

    Files in This Item:

    File Description SizeFormat
    index.html0KbHTML1269View/Open


    All items in CNU IR are protected by copyright, with all rights reserved.


    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - Feedback