Chia Nan University of Pharmacy & Science Institutional Repository:Item 310902800/21918
English  |  正體中文  |  简体中文  |  全文笔数/总笔数 : 18034/20233 (89%)
造访人次 : 23622828      在线人数 : 671
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
搜寻范围 查询小技巧:
  • 您可在西文检索词汇前后加上"双引号",以获取较精准的检索结果
  • 若欲以作者姓名搜寻,建议至进阶搜寻限定作者字段,可获得较完整数据
  • 进阶搜寻


    jsp.display-item.identifier=請使用永久網址來引用或連結此文件: https://ir.cnu.edu.tw/handle/310902800/21918


    標題: A DCC Analysis of Stock Market and Exchange Rates: An Evidence Study of the South Korea Country
    作者: Wann-Jyi Horng
    Ming-Chi Huang
    貢獻者: 通識教育中心
    醫務管理系
    關鍵字: exchange rate
    stock market returns
    DCC
    asymmetric effect
    bivariate EGARCH model
    日期: 2008-06
    上傳時間: 2009-11-02 17:03:17 (UTC+8)
    摘要: This paper studies the relatedness and the model construction of exchange rate volatility and the South Korea stock market returns. Empirical results show that we can construct a bivariate EGARCH ( 1 , 2 ) , model with a dynamic conditional correlation ( DCC ) to analyze the relationship of exchange rate volatility and Korea stock market returns. The average estimation value of the DCC coefficient for these two markets equals to -0 .1 961, this result indicates that the exchange rate volatility negatively affects the South Korea stock market. Empirical result also shows that there exists an asymmetrical effect on the South Korea stock, market, but the exchange rate volatility does not have the asymmetrical effect. Based on the good news and bad news (Nelson, 1991 ) of the stock market the bivariate EGARCH (1 , 2) model with a DCC has the better explanation ability compared to the bivariate GARCH (1 , 1) model .
    關聯: The Third International Conference on innovative Computing, Information and Control,起迄日:2008/6/18~2008/6/20,地點:Dalian, China.
    显示于类别:[通識教育中心] 會議論文
    [醫務管理系(所)] 會議論文

    文件中的档案:

    档案 描述 大小格式浏览次数
    97_112_pro.pdf419KbAdobe PDF379检视/开启


    在CNU IR中所有的数据项都受到原著作权保护.

    TAIR相关文章

    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - 回馈