English  |  正體中文  |  简体中文  |  Items with full text/Total items : 17744/20032 (89%)
Visitors : 7358102      Online Users : 259
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version
    Please use this identifier to cite or link to this item: http://ir.cnu.edu.tw/handle/310902800/1900

    標題: 市售油炸豆皮商品壽命之研究及其檢定
    Shelf Life of Commercial Fried-Topie and Its Assessment
    作者: 洪端良
    Tuan-Liang Hong
    貢獻者: 食品科技系
    關鍵字: 油炸豆皮
    Fried topie
    Near infrared spectroscopy (NIR)
    Shelf life
    Lipid oxidation
    日期: 1999
    上傳時間: 2008-07-18 16:23:26 (UTC+8)
    出版者: 台南縣:嘉南藥理科技大學食品科技系
    摘要: 油炸豆皮以聚乙烯袋包裝分別貯存於4.degree.C、25.degree.C及37.degree.C。結果顯示貯存於25.degree.C,6週之樣品,其TBA值、顏色及品評分數皆與新鮮者具顯著性差異,且經貯存14週之油炸豆皮之黴菌數為5.8* 10/sup 6/(cfu/g)。以近紅外線光譜技術建立之品質分析模式,經可性度測試結果顯示,可有效的區別品質較差之油炸豆皮產品。
    The fried-topie, packed with polyethylene bag, incubated at 4, 25, and 37.degree.C, respectively. Samples stored at 25.degree.C for 6 weeks were found that the TBA (thiobarbituric acid) value, color and sensory score was significant different with fresh samples. Furthermore, the samples stored for 16 weeks were found the number of mold was 5.8*10/sup 6/(cfu/g). Evaluation model using near infrared spectroscopy (NIRS) were developed for the quality of stored fried-topie samples. Simulation experiments demonstrated that model were able to identify the sample quality. Statistical analysis suggested that models could be used as a rapid analytical technique for assessment of commercial fried-topie products.
    關聯: 計畫編號:NSC88-2214-E041-003
    Appears in Collections:[ 食品科技系 ] 科技部計畫

    Files in This Item:

    File Description SizeFormat
    NSC88-2214-E041-003.pdf138KbAdobe PDF360View/Open

    All items in CNU IR are protected by copyright, with all rights reserved.

    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - Feedback